Intelligent location of simultaneously active acoustic emission sources:
Part II
T. Kosel and I. Grabec
Igor Grabec update to 2007-05-23
https://arxiv.org/abs/0704.0050
Part I describes an intelligent acoustic emission locator, while Part IIdiscusses blind source separation, time delay estimation and location of twocontinuous acoustic emission sources. Acoustic emission (AE) analysis is used for characterization and location ofdeveloping defects in materials. AE sources often generate a mixture of variousstatistically independent signals. A difficult problem of AE analysis isseparation and characterization of signal components when the signals fromvarious sources and the mode of mixing are unknown. Recently, blind sourceseparation (BSS) by independent component analysis (ICA) has been used to solvethese problems. The purpose of this paper is to demonstrate the applicabilityof ICA to locate two independent simultaneously active acoustic emissionsources on an aluminum band specimen. The method is promising fornon-destructive testing of aircraft frame structures by acoustic emissionanalysis.